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You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: April 25, 2024

45786 article(s) found. Sorted by publication dates. (Help)
  • 二瓶 正俊, 小野寺潤, 尾上二郎, 小野寺潤, 尾上二郎. ねじS-N線図の推定と新しいねじ設計資料の提案. 日本機械学会論文集. 63 [605] (1997) 207-212
  • 野田哲二, 野田哲二, SUZUKI, Hiroshi, SUZUKI Hiroshi. Enrichment of 28Si by infrared laser irradiation. Functionally Granded Materials. (1997) 725-730
  • A.Donni, A.Furrer, E.Bauer, H. Kitazawa, M.Zolliker, A. Dönni, A. Furrer, E. Bauer, M. Zolliker. Crystalline-electric field excitations of RPd2Ga3 studied by powder neutron scattering. Zeitschrift für Physik B Condensed Matter. 104 [3] (1997) 403-409 10.1007/s002570050468
  • 松尾利行, 西田豊明, 星本健一, 松尾利行, 西田豊明, 星本健一. 金属材料論文からの技術情報空間の構築と探訪の知的文核. 人工知能学会誌. 12 [1] (1997) 68-77
  • H.G.Read, W.T.Reynolds, K. Hono, 樽井敏三, H.G. Read, W.T. Reynolds, T. Tarui. APFIM and TEM studies of drawn pearlitic wire. Scripta Materialia. 37 [8] (1997) 1221-1230 10.1016/s1359-6462(97)00223-6
  • D.M.Baskin, K.T.Faber, 大塚 秀幸, D.M.Baskin, K.T.Faber. 強磁場中ゲルキャスト法による靭性に富む単相セラミックス積層組織の形成. 日本金属学会誌. 61 [12] (1997) 1306-1310
  • 高橋稔彦, 山崎真吾, 山崎真吾, 高橋稔彦, 山崎真吾, 山崎真吾. 遅れ破壊発生の水素量の定量化. 金属. 67 [12] (1997) 21-27
  • KATAYAMA, Hideki, 田原晃, 小玉俊明, Chalothorn.Bhamornst, 田原晃, 小玉俊明, Chalothorn.Bhamornst. Atmospheric degradation and corrosion resistance of organic-coating. Journal of the Electrochemical Society. 41 (1997) 113-121
  • T.Shishido, H.Yamauchi, K.Kudou, S.Okada, J.Ye, A.Yoshikawa, H.Horiuchi, T.Fukuda, Toetsu Shishido, Hiroshi Yamauchi, Kunio Kudou, Shigeru Okada, Jinhua Ye, Akira Yoshikawa, Hiroyuki Horiuchi, Tsuguo Fukuda. Solid solution range of boron microhardness and magnetic properties of the perovskite-type GdRh3B obtained by arc-melting synthe. Japanese Journal of Applied Physics. 36 [Part 2, No. 11A] (1997) L1436-L1439 10.1143/jjap.36.l1436
  • M. Ohnuma, K. Hono, 阿部英司, H. Onodera, 三谷誠司, 藤森啓安, E. Abe, S. Mitani, H. Fujimori. Microstructure of Co-Al-O granular thin films. Journal of Applied Physics. 82 [11] (1997) 5646-5652 10.1063/1.366425
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