| 49714 article(s) found. Sorted by publication dates. (Help) | |
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| Sachiko Hiromoto, Takao Hanawa, Kazuyuki Ogawa. Thermodynamic Structural Stability and Polarization behavior of Cast Amorphous Alloy. MATERIALS TRANSACTIONS. 44 [9] (2003) 1824-1829 10.2320/matertrans.44.1824 | |
| 苅谷 義治. 日本における溶接の展望(Ⅲ-5マイクロ接合,マイクロソルダリング). JOURNAL OF THE JAPAN WELDING SOCIETY(溶接学会誌). 72 [5] (2003) 378-379 | |
| KOIDE, Yasuo. On the peculiarity of depletion regions in diamond pn-junction.. JAPANESE JOURNAL OF APPLIED PHYSICS. 42 [11] (2003) 6800-6803 | |
| Tomoya Konishi, Takaharu Hondo, Tetsuo Araki, Keishi Nishio, Toshio Tsuchiya, Takehisa Matsumoto, Shigeru Suehara, Shin-ichi Todoroki, Satoru Inoue. Investigation of glass formation and color properties in the P2O5–TeO2–ZnO system. Journal of Non-Crystalline Solids. 324 [1-2] (2003) 58-66 10.1016/s0022-3093(03)00187-x | |
| Shigeki Otani, Yi Xuan, Yoshiyuki Yajima, Takao Mori. Flux growth of YB4 crystals and their magnetic properties. Journal of Alloys and Compounds. 361 [1-2] (2003) L1-L3 10.1016/s0925-8388(03)00388-8 | |
| S. Otani, T. Mori. Flux growth of CaB6 crystals. JOURNAL OF MATERIALS SCIENCE LETTERS. 22 (2003) 1065-1066 10.1023/a:1024922505153 | |
| Minoru Otani, Hidetugu Yoshida, Kunio Yoshida. ZrB2 substrate for nitride semiconductors. Japanese Journal of Applied Physics. 42 [Part 1, No. 7A] (2003) 4359-4360 10.1143/jjap.42.2260 | |
| G. Fuchs, G.Fuchs, S.-L. Drechsler, K.-H. Muller, A. Handstein, S.V. Shulga, G.Behr, A. Gumbel, J.Eckert, K. Nenkov, V.N.Narozhnyi, L. Schultz, H. Eschrig, OTANI, Shigeki, H. Rosner, W.E. Pickett. A comparative study of MgB2 and other diborides. JOURNAL OF LOW TEMPERATURE PHYSICS. 131 (2003) 1159-1163 10.1023/a:1023473731568 | |
| NAKAJIMA, HIROMITSU, MORI, Toshiyuki, 渡辺遵. Influence of pH on Photoadsorption of Dissolved Oxygen in TiO2 Suspensions. JAPANESE JOURNAL OF APPLIED PHYSICS. 42 [10] (2003) 6623-6624 | |
| Tadayuki Kondo, Hideo Itozaki, Roman Koetitz. Evaluation of Flux Guide Performance in a SQUID Microscope. Superconductor Science and Technology. 16 [12] (2003) 1528-1530 10.1088/0953-2048/16/12/045 | |