HOME > Article > DetailElectron microscopy studies of the intermediate layers at the SiO2/GaN interfaceKazutaka Mitsuishi, Koji Kimoto, Yoshihiro Irokawa, Taku Suzuki, Kazuya Yuge, Toshihide Nabatame, Shinya Takashima, Katsunori Ueno, Masaharu Edo, Kiyokazu Nakagawa, Yasuo Koide. Japanese Journal of Applied Physics 56 [11] 110312. 2017.https://doi.org/10.7567/jjap.56.110312 NIMS author(s)MITSUISHI, KazutakaKIMOTO, KojiIROKAWA, YoshihiroSUZUKI, TakuNABATAME, ToshihideFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-11-22 21:06:37 +0900 Updated at: 2026-10-03 05:36:20 +0900
