Center for Basic Research on Materials Advanced Materials Characterization Field | SAMURAI, NIMS Researchers Directory Service

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Center for Basic Research on Materials, Advanced Materials Characterization Field: 41 researcher(s) found.
Sorted by the alphabetical order. Displaying from 11 to 20.

IMANAKA, Yasutaka (今中康貴)

Deputy Platform Director, Materials Fabrication and Analysis Platform, Advanced Engineering and Services Division

Keywords: 物性II 応用物性・結晶工学応用物理学一般

ISHIDA, Nobuyuki (石田暢之)

Principal Researcher, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

ISHII, Yuta (石井祐太)

Senior Researcher, Synchrotron Radiation Imaging Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: 放射光計測、イメージング、磁性体、計測インフォマティクス

ITAKURA, Akiko (板倉明子)

Specially Appointed Research Fellow, In-situ Electron Microscopy Technique Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: Surface stress, Thin film, Sensing,

KAWAI, Shigeki (川井茂樹)

Group Leader, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: High resolution atomic force microscopy for surface chemistry

KAWAMOTO, Naoyuki (川本直幸)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: 透過電子顕微鏡、局所導電性評価、電磁場評価

KIKKAWA, Jun (吉川純)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: EELS，STEM，phonon，subgap state

KIKUGAWA, Naoki (菊川直樹)

Chief Researcher, High Magnetic Field Physics Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords: 酸化物，電子状態，量子効果

KIMOTO, Koji (木本浩司)

Director, Center for Basic Research on Materials

Keywords: Electron Microscopy, Electron Energy-Loss Spectroscopy, Material Characterization

KOMEDA, Tadahiro (米田忠弘)

Specially Appointed Research Fellow, Nanoprobe Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

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