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Center for Basic Research on Materials, Advanced Materials Characterization Field: 43 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 10.
- Keywords
high-resolution atomic force microscopy, scanning tunneling microscopy
- Keywords
核磁気共鳴、強磁場、光ポンピング、動的核偏極
- Keywords
eletron microscopy, self-assembly, in-situ imaging, single molecule imaging
- Keywords
有機合成、表面化学合成、有機デバイス、自己組織化








