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Center for Basic Research on Materials, Advanced Materials Characterization Field, Electron Microscopy Group: 6 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 6.

CRETU, Ovidiu (コレツ オヴィヂュ)

Senior Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

HARANO, Koji (原野 幸治)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

eletron microscopy, self-assembly, in-situ imaging, single molecule imaging

KAWAMOTO, Naoyuki (川本 直幸)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

透過電子顕微鏡、局所導電性評価、電磁場評価

KIKKAWA, Jun (吉川 純)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

EELS，STEM，phonon，subgap state

KIMOTO, Koji (木本 浩司)

Director, Center for Basic Research on Materials

Keywords

Electron Microscopy, Electron Energy-Loss Spectroscopy, Material Characterization
電子顕微鏡　電子エネルギー損失分光法　ナノ構造科学　無機化学　応用物性・結晶工学

ZHANG, Han (張 晗)

Senior Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials