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NIMS Award Symposium 2025

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Center for Basic Research on Materials, Advanced Materials Characterization Field, Electron Microscopy Group: 7 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 7.

CRETU, Ovidiu

CRETU, Ovidiu (コレツ オヴィヂュ)

Senior Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

HARANO, Koji

HARANO, Koji (原野 幸治)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

eletron microscopy, self-assembly, in-situ imaging, single molecule imaging

KAWAMOTO, Naoyuki

KAWAMOTO, Naoyuki (川本 直幸)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

透過電子顕微鏡、局所導電性評価、電磁場評価

KIKKAWA, Jun

KIKKAWA, Jun (吉川 純)

Principal Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

EELS，STEM，phonon，subgap state

KIMOTO, Koji

KIMOTO, Koji (木本 浩司)

Director, Center for Basic Research on Materials

Keywords

Electron Microscopy, Electron Energy-Loss Spectroscopy, Material Characterization

MANNA, Biplab

MANNA, Biplab (マンナ ビプラブ)

NIMS Postdoctoral Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

Porous Materials, 2D MOF materials, Organic and polymeric materials, Precision Molecular Recognition, Low-dose electron microscopic analysis

ZHANG, Han

ZHANG, Han (張 晗)

Senior Researcher, Electron Microscopy Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

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