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最終更新時刻: 2026-10-20 04:35:04 +0900

1 article(s) found. Sorted by publication dates. (Help)
CHEN, Jun, SEKIGUCHI, Takashi, FUKATA, Naoki, TAKASE, Masami, NEMOTO, Yoshihiro, Ryu Hasunuma, Kikuo Yamabe, Motoyuki Sato, Keisaku Yamada, CHIKYOW, Toyohiro. An Electron-Beam-Induced Current Investigation of Electrical Defects in High-k Gate Stacks. ECS Transcations. (2010) 299-313