HOME > 会議録 > 書誌詳細Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias OperationNAGATA, Takahiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, K. Kobayashi, CHIKYOW, Toyohiro. ECS TRANSACTIONS 301-310. 2014.https://doi.org/10.1149/06102.0jolecs NIMS著者長田 貴弘山下 良之吉川 英樹知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 02:31:50 +0900更新時刻: 2025-01-16 07:57:58 +0900
