Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation | SAMURAI, NIMS Researchers Directory Service

Scheduled downtime (October 31st and November 1st, 2026) (2026-10-29)

HOME > Proceedings > Detail

Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation

NAGATA, Takahiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, K. Kobayashi, CHIKYOW, Toyohiro.

ECS TRANSACTIONS 301-310. 2014.

https://doi.org/10.1149/06102.0jolecs

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-02-27 02:31:50 +0900 Updated at: 2026-10-08 08:12:40 +0900

▲ Go to the top of this page