Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation | SAMURAI, NIMS Researchers Directory Service

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Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation

NAGATA, Takahiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, K. Kobayashi, CHIKYOW, Toyohiro.

ECS TRANSACTIONS 301-310. 2014.

https://doi.org/10.1149/06102.0jolecs

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-02-27 02:31:50 +0900Updated at: 2024-04-02 06:40:07 +0900

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