SAMURAI - NIMS Researchers Database

HOME > Proceedings > Detail

Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation

ECS TRANSACTIONS 301-310. 2014.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-27 02:31:50 +0900Updated at: 2024-06-04 11:06:35 +0900

    ▲ Go to the top of this page