HOME > 会議録 > 書誌詳細Hard X-ray Photoelectron Spectroscopic Study on High-k Dielectrics Based Resistive random access memoryNAGATA, Takahiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, CHIKYOW, Toyohiro. ECS TRANSACTIONS 39-47. 2017.NIMS著者長田 貴弘山下 良之吉川 英樹知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-08-22 21:58:17 +0900更新時刻: 2018-06-05 14:01:41 +0900
