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Hard X-ray Photoelectron Spectroscopic Study on High-k Dielectrics Based Resistive random access memory

NAGATA, Takahiro, YAMASHITA, Yoshiyuki, YOSHIKAWA, Hideki, CHIKYOW, Toyohiro.
ECS TRANSACTIONS 39-47. 2017.

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    Created at: 2017-08-22 21:58:17 +0900Updated at: 2018-06-05 14:01:41 +0900

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