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硬X線光電子分光法を用いたMgドープIn0.70Ga0.30Nの 表面-バルク電子状態評価
(Surface and Bulk Electronic structures of Mg doped In0.70Ga0.30N Analyzed by Hard X-ray Spectroscopy)
第60回応用物理学会春季学術講演会. March 27, 2013-March 30, 2013.
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Created at: 2017-02-14 11:12:27 +0900 Updated at: 2017-07-10 21:34:20 +0900