HOME > Presentation > DetailHard X-ray Photoelectron Spectroscopic Study of Bottom Electrode Effect on Interface Reaction in Resistive Changing Memory Structure長田 貴弘, 山下 良之, 吉川 英樹, 井村 将隆, オウ セウンジン, 小橋 和義, 知京 豊裕. 2015 IWDTF. 2015.NIMS author(s)NAGATA, TakahiroYAMASHITA, YoshiyukiYOSHIKAWA, HidekiIMURA, MasatakaCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:01:32 +0900Updated at: 2017-07-10 22:16:00 +0900