HOME > Presentation > Detail
硬X線光電子分光法を用いたInNの表面電子状態評価
(Surface Electronic structures of InN Analyzed by Hard X-ray Spectroscopy)
第72回応用応用物理学会学術講演会. September 11, 2012-September 14, 2012.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:59:26 +0900 Updated at: 2018-06-05 13:10:59 +0900