HOME > 口頭発表 > 書誌詳細Defect detection of diamond by etch pit formation and correlation analysis with electric propertiesSHIMAOKA, Takehiro, ICHIKAWA, Kimiyoshi, WATANABE, Kenji, KOIZUMI, Satoshi, TERAJI, Tokuyuki. Hasselt Diamond Workshop 2019 (SBDD XXIV). 2019.NIMS著者市川 公善渡邊 賢司小泉 聡寺地 徳之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-05-28 03:00:46 +0900更新時刻: 2019-05-28 03:00:46 +0900