HOME > Presentation > DetailDefect detection of diamond by etch pit formation and correlation analysis with electric propertiesSHIMAOKA, Takehiro, ICHIKAWA, Kimiyoshi, WATANABE, Kenji, KOIZUMI, Satoshi, TERAJI, Tokuyuki. Hasselt Diamond Workshop 2019 (SBDD XXIV). 2019.NIMS author(s)ICHIKAWA, KimiyoshiWATANABE, KenjiKOIZUMI, SatoshiTERAJI, TokuyukiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-05-28 03:00:46 +0900Updated at: 2019-05-28 03:00:46 +0900