HOME > Presentation > Detail
硬X線光電子分光法を用いたMgドープInNの表面およびバルク電子状態評価
(Surface and Bulk Electronic Structure of Mg-doped InN Analyzed by Hard X-ray Photoelectron Spectroscopy )
第31回電子材料シンポジウム. 2012.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:01:50 +0900Updated at: 2017-07-10 21:22:57 +0900