HOME > Presentation > DetailDiamond logic circuits with depletion- and enhancement-mode MOSFETs劉 江偉, 大里 啓孝, 廖 梅勇, 井村 将隆, 渡辺 英一郎, 小出 康夫. 29th International Conference on Defects in Semiconductors. July 31, 2017-August 04, 2017.NIMS author(s)LIU, JiangweiOOSATO, HirotakaLIAO, MeiyongIMURA, MasatakaKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-04-18 22:55:44 +0900Updated at: 2018-06-05 14:07:47 +0900