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Diamond logic circuits with depletion- and enhancement-mode MOSFETs

29th International Conference on Defects in Semiconductors. July 31, 2017-August 04, 2017.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-04-18 22:55:44 +0900Updated at: 2018-06-05 14:07:47 +0900

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