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Secondary Electron Imaging for Multilayer Ceramic Capacitors with Applied Several Voltages using Helium Ion Microscope
(ヘリウムイオン顕微鏡による印加電圧値を変化させた積層型セラミックコンデンサの二次電子画像化)
Recent Progress on Interfacial Energy Conversion. 2017-05-17.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-05-23 22:59:05 +0900 Updated at: 2018-06-05 14:08:59 +0900