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Electrical Potential Imaging of Multilayer Ceramic Capacitors with Arbitrary Applied Voltages using Helium Ion Microscope
(ヘリウムイオン顕微鏡を用いた任意の電圧印加を伴う積層型セラミックコンデンサの電位分布画像化)
The 8th International Symposium on Surface Science (ISSS-8). October 22, 2017-October 26, 2017.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-11-01 22:01:46 +0900Updated at: 2018-06-05 14:14:13 +0900