HOME > その他の文献 > 書誌詳細Electron-beam-induced current study of breakdown behavior of high-k gate MOSFETsSEKIGUCHI, Takashi, CHEN, Jun, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Motoyuki Sato, Ryu Hasunuma, Kikuo Yamabe, Yasuo Nar. SOLID STATE PHENOMENA 461-466. 2010.https://doi.org/10.4028/www.scientific.net/156-158.461 NIMS著者陳 君深田 直樹知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-09-05 12:28:43 +0900更新時刻: 2025-03-19 06:30:56 +0900
