HOME > Misc > DetailElectron-beam-induced current study of breakdown behavior of high-k gate MOSFETsSEKIGUCHI, Takashi, CHEN, Jun, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Motoyuki Sato, Ryu Hasunuma, Kikuo Yamabe, Yasuo Nar. SOLID STATE PHENOMENA 461-466. 2010.https://doi.org/10.4028/www.scientific.net/156-158.461 NIMS author(s)CHEN, JunFUKATA, NaokiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2022-09-05 12:28:43 +0900Updated at: 2024-04-02 06:39:45 +0900
