SAMURAI - NIMS Researchers Database

HOME > Search researchers > Search by article

Search by article

You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: May 02, 2024

382 article(s) found. Sorted by publication dates. (Help)
  • KIM, Byung-Nam, HIRAGA, Keijiro. Simulation of Diffusional Creep Accompanied by Grain Growth in 2-Dimensional Polycrystalline Solids. Acta Materialia. (2000) 4151-4159
  • QIU, Hai, 榎学, 岸輝雄. A new dynamic fracture toughness model for ductile fracture. Acta MATERIALIA. (2000)
  • QIU, Hai, 榎学, 岸輝雄. A new static fracture toughness model for ductile fracture. ACTA MATERIALIA. (2000)
  • 大沼正人, ONODERA, Hidehiro, HONO, Kazuhiro, 吉沢克仁, Linderoth Soren, Pedersen Jan Skov, S Linderoth, J.S Pedersen, Y Yoshizawa. Small-angle neutron scattering and differential scanning calorimetry studies on the copper clustering stage of Fe-Si-B-Nb-Cu nan. Acta Materialia. 48 [20] (2000) 4783-4790 10.1016/s1359-6454(00)00277-9
  • 郭俊清, TSUKAMOTO, Susumu, KIMURA, Takashi, 中江秀雄. Nucleation process control of undercooled stainless steel by external nucleation seed. Acta Materialia. (1999)
  • KIM, Byung-Nam, HIRAGA, Keijiro, SAKKA, Yoshio, 安乗旭. A Grain Boundary Diffusion Model of Dynamic Grain Growth during Superplastic Deformation. Acta Materialia. (1999)
  • PING, De-hai, HONO, Kazuhiro, 金清裕和, 広沢哲. Microstructural evolution of Fe3B/Nd2Fe14B nanocomposite masnets microalloyed with W and N. Acta materialia. (1999)
  • 大橋鉄也, INOUE, Tadanobu, 鳥塚史郎, TSUZAKI, Kaneaki, 長井寿. Plastic strain and ferrite grain size after thermo-mechanical treatment of Si-Mu Steel bolcks. Acta Materialia. (1999)
  • YIN, Fuxing, OHSAWA, Yoshiaki, 佐藤彰, 川原浩司, 佐藤彰, 川原浩司. Phase decomposition of the phase during aging in a Mn-30at.% Cu alloy. Acta Materialia. 48 (1999)
  • T Hirano, 出村 雅彦, D.Golberg, D Golberg. 化学量論組成Ni3Alの降伏応力逆温度依存領域におけるシュミット則成立について. Acta Materialia. 47 [12] (1999) 3441-3446 10.1016/s1359-6454(99)00202-5
  • ▲ Go to the top of this page