HOME > 論文 > 書誌詳細Surface morphology smoothing of a 2 inch-diameter GaN homoepitaxial layer observed by X-ray diffraction topographyJaemyung Kim, Okkyun Seo, Satoshi Hiroi, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata. RSC Advances 10 [4] 1878-1882. 2020.https://doi.org/10.1039/c9ra08882b Open Access Royal Society of Chemistry (RSC) (Publisher) NIMS著者色川 芳宏生田目 俊秀小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-03-13 03:00:19 +0900更新時刻: 2024-05-01 05:04:05 +0900
