Systematic characterization of nanoscale <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>h</mml:mi></mml:math> -BN quantum sensor spots created by helium-ion microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Systematic characterization of nanoscale h -BN quantum sensor spots created by helium-ion microscopy

Hao Gu, Moeta Tsukamoto, Yuki Nakamura, Shu Nakaharai, Takuya Iwasaki, Kenji Watanabe, Takashi Taniguchi, Shinichi Ogawa, Yukinori Morita, Kento Sasaki, Kensuke Kobayashi.

Physical Review Applied 22 [5] 054026. 2024.

https://doi.org/10.1103/physrevapplied.22.054026

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MDRavailable Systematic characterization of nanoscale <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>h</mml:mi></mml:math> -BN quantum sensor spots created by helium-ion microscopy

作成時刻: 2024-11-19 03:14:33 +0900更新時刻: 2025-01-22 04:31:10 +0900

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