Systematic characterization of nanoscale <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>h</mml:mi></mml:math> -BN quantum sensor spots created by helium-ion microscopy | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

Systematic characterization of nanoscale h -BN quantum sensor spots created by helium-ion microscopy

Hao Gu, Moeta Tsukamoto, Yuki Nakamura, Shu Nakaharai, Takuya Iwasaki, Kenji Watanabe, Takashi Taniguchi, Shinichi Ogawa, Yukinori Morita, Kento Sasaki, Kensuke Kobayashi.

Physical Review Applied 22 [5] 054026. 2024.

https://doi.org/10.1103/physrevapplied.22.054026

Open Access Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Systematic characterization of nanoscale <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>h</mml:mi></mml:math> -BN quantum sensor spots created by helium-ion microscopy

Created at: 2024-11-19 03:14:33 +0900 Updated at: 2026-06-08 04:31:38 +0900

▲ Go to the top of this page