Investigation of intermediate layers in oxides/GaN(0001) by electron microscopy
| 著者 | MITSUISHI, Kazutaka, IROKAWA, Yoshihiro, NABATAME, Toshihide, KIMOTO, Koji, KOIDE, Yasuo. |
|---|---|
| 掲載誌名 | JAPANESE JOURNAL OF APPLIED PHYSICS 57 [11] |
| 出版社 | |
| 発表年 | 2018 |
| 言語 | English |
| 著者 | MITSUISHI, Kazutaka, IROKAWA, Yoshihiro, NABATAME, Toshihide, KIMOTO, Koji, KOIDE, Yasuo. |
|---|---|
| 掲載誌名 | JAPANESE JOURNAL OF APPLIED PHYSICS 57 [11] |
| 出版社 | |
| 発表年 | 2018 |
| 言語 | English |