HOME > 論文 > 書誌詳細Investigation of intermediate layers in oxides/GaN(0001) by electron microscopyIROKAWA, Yoshihiro, MITSUISHI, Kazutaka, NABATAME, Toshihide, KIMOTO, Koji, KOIDE, Yasuo. JAPANESE JOURNAL OF APPLIED PHYSICS 57 [11] . 2018.NIMS著者色川 芳宏三石 和貴生田目 俊秀木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-04 09:37:04 +0900 更新時刻: 2019-05-10 18:54:47 +0900
