HOME > Article > DetailInvestigation of intermediate layers in oxides/GaN(0001) by electron microscopyIROKAWA, Yoshihiro, MITSUISHI, Kazutaka, NABATAME, Toshihide, KIMOTO, Koji, KOIDE, Yasuo. JAPANESE JOURNAL OF APPLIED PHYSICS 57 [11] . 2018.NIMS author(s)IROKAWA, YoshihiroMITSUISHI, KazutakaNABATAME, ToshihideKIMOTO, KojiKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-04 09:37:04 +0900Updated at: 2019-05-10 18:54:47 +0900
