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Investigation of Al2O3/GaN interface properties by sub-bandgap photo-assisted capacitance-voltage technique

Yoshihiro Irokawa, Toshihide Nabatame, Kazuya Yuge, Akira Uedono, Akihiko Ohi, Naoki Ikeda, Yasuo Koide.
AIP Advances 9 [8] 085319. 2019.
https://doi.org/10.1063/1.5098489
Open Access AIP Publishing (Publisher)

NIMS author(s)

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    Created at: 2019-08-27 03:00:15 +0900 Updated at: 2026-10-30 05:34:48 +0900

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