HOME > 論文 > 書誌詳細Defects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interfaceBaoe Li, Yutaka Adachi, Jianyong Li, Hedeyo Okushi, Isao Sakaguchi, Shigenori Ueda, Hideki Yoshikawa, Yoshiyuki Yamashita, Shoichi Senju, Keisuke Kobayashi, Masatomo Sumiya, Hajime Haneda, Naoki Ohashi. Applied Physics Letters 98 [8] 082101. 2011.https://doi.org/10.1063/1.3556440 NIMS著者安達 裕坂口 勲上田 茂典吉川 英樹山下 良之角谷 正友大橋 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:19:16 +0900 更新時刻: 2026-10-30 07:44:29 +0900
