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Defects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interface

著者Baoe Li, Yutaka Adachi, Jianyong Li, Hedeyo Okushi, Isao Sakaguchi, Shigenori Ueda, Hideki Yoshikawa, Yoshiyuki Yamashita, Shoichi Senju, Keisuke Kobayashi, Masatomo Sumiya, Hajime Haneda, Naoki Ohashi.
掲載誌名Applied Physics Letters 98 [8] 082101
ISSN: 00036951, 10773118
ESIでのカテゴリ: PHYSICS
出版社AIP Publishing
発表年2011
言語English
DOIhttps://doi.org/10.1063/1.3556440
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