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著者名Baoe Li, Yutaka Adachi, Jianyong Li, Hedeyo Okushi, Isao Sakaguchi, Shigenori Ueda, Hideki Yoshikawa, Yoshiyuki Yamashita, Shoichi Senju, Keisuke Kobayashi, Masatomo Sumiya, Hajime Haneda, Naoki Ohashi.
タイトルDefects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interface
掲載誌名Applied Physics Letters 98 [8] 082101
ISSN: 00036951 0168583X 10773118
発表年2011
言語English
ESIでのカテゴリPHYSICS
DOIhttps://doi.org/10.1063/1.3556440
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