HOME > Article > DetailDefects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interfaceBaoe Li, Yutaka Adachi, Jianyong Li, Hedeyo Okushi, Isao Sakaguchi, Shigenori Ueda, Hideki Yoshikawa, Yoshiyuki Yamashita, Shoichi Senju, Keisuke Kobayashi, Masatomo Sumiya, Hajime Haneda, Naoki Ohashi. Applied Physics Letters 98 [8] 082101. 2011.https://doi.org/10.1063/1.3556440 NIMS author(s)ADACHI, YutakaSAKAGUCHI, IsaoUEDA, ShigenoriYOSHIKAWA, HidekiYAMASHITA, YoshiyukiSUMIYA, MasatomoHANEDA, HajimeOHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:19:16 +0900Updated at: 2024-03-31 15:24:51 +0900
