HOME > 論文 > 書誌詳細Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitorTakahiro Nagata, Somu Kumaragurubaran, Yoshifumi Tsunekawa, Yoshiyuki Yamashita, Shigenori Ueda, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Seungjun Oh, Toyohiro Chikyow. Japanese Journal of Applied Physics 55 [6S1] 06GJ12. 2016.https://doi.org/10.7567/jjap.55.06gj12 NIMS著者長田 貴弘山下 良之上田 茂典知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-07-11 14:07:42 +0900 更新時刻: 2026-10-03 05:15:06 +0900
