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著者名Takahiro Nagata, Somu Kumaragurubaran, Yoshifumi Tsunekawa, Yoshiyuki Yamashita, Shigenori Ueda, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Seungjun Oh, Toyohiro Chikyow.
タイトルInterface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor
掲載誌名Japanese Journal of Applied Physics 55 [6S1] 06GJ12
ISSN: 00319015 13474065 00214922
発表年2016
言語English
ESIでのカテゴリPHYSICS
DOIhttps://doi.org/10.7567/jjap.55.06gj12
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