Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor | SAMURAI, NIMS Researchers Directory Service

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Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor

Takahiro Nagata, Somu Kumaragurubaran, Yoshifumi Tsunekawa, Yoshiyuki Yamashita, Shigenori Ueda, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Seungjun Oh, Toyohiro Chikyow.

Japanese Journal of Applied Physics 55 [6S1] 06GJ12. 2016.

https://doi.org/10.7567/jjap.55.06gj12

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-07-11 14:07:42 +0900 Updated at: 2026-11-04 05:15:47 +0900

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