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Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor

Takahiro Nagata, Somu Kumaragurubaran, Yoshifumi Tsunekawa, Yoshiyuki Yamashita, Shigenori Ueda, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Seungjun Oh, Toyohiro Chikyow.
Japanese Journal of Applied Physics 55 [6S1] 06GJ12. 2016.
https://doi.org/10.7567/jjap.55.06gj12

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    Created at: 2016-07-11 14:07:42 +0900Updated at: 2024-04-01 22:40:31 +0900

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