Lattice-plane orientation mapping of homo-epitaxial GaN(0001) thin films via grazing-incidence X-ray diffraction topography in 2-in. wafer | SAMURAI, NIMS Researchers Directory Service

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Lattice-plane orientation mapping of homo-epitaxial GaN(0001) thin films via grazing-incidence X-ray diffraction topography in 2-in. wafer

Jaemyung Kim, Okkyun Seo, Chulho Song, Satoshi Hiroi, Yanna Chen, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata.

Applied Physics Express 11 [8] 081002. 2018.

https://doi.org/10.7567/apex.11.081002

Open Access Japan Society of Applied Physics (Publisher)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2018-07-08 15:34:17 +0900Updated at: 2024-03-29 22:52:38 +0900

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