HOME > 会議録 > 書誌詳細Inelastic scattering cross section of Si from angular dependent reflection electron energy loss spectra JIN, Hua, YOSHIKAWA, Hideki, IWAI, Hideo, TANUMA, Shigeo, S. Tougaard. JOURNAL OF SURFACE ANALYSIS 321-324. 2009.NIMS著者吉川 英樹岩井 秀夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:37:09 +0900更新時刻: 2017-03-17 03:39:40 +0900
