HOME > Proceedings > DetailInelastic scattering cross section of Si from angular dependent reflection electron energy loss spectra JIN, Hua, YOSHIKAWA, Hideki, IWAI, Hideo, TANUMA, Shigeo, S. Tougaard. JOURNAL OF SURFACE ANALYSIS 321-324. 2009.NIMS author(s)YOSHIKAWA, HidekiIWAI, HideoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:37:09 +0900Updated at: 2017-03-17 03:39:40 +0900