| 16件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| SUZUKI, Mineharu, HARADA, Yoshitomo, 上島 豊, MATSUNAMI, Shigeyuki, 後藤 敬典, YOSHIKAWA, Hideki. Application of Electronic Laboratory Notebook for Analysis Records in Materials Research. Journal of Surface Analysis. (2019) 188-189 | |
| MITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko. Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures. Journal of Surface Analysis. (2019) 190-191 | |
| Nobuhiro Ishikawa, Tadashi Mitsui, Masaki Takeguchi, Kazutaka Mitsuishi. In-situ observation of the interaction silicon and hematite. Journal of Surface Analysis. (2019) 144-145 10.1384/jsa.26.144 | |
| FUJITA Takaya, KAREN, Akiya, ITO Hiroshi, FUJITA, Daisuke. Standardization and quantification of the carrier concentration in semiconductor devices using electric SPM. Journal of Surface Analysis. (2012) 76-80 | |
| OGIWARA, Toshiya, TANUMA, Shigeo. Auger Depth Profiling Analysis Using a inclined Holder . JOURNAL OF SURFACE ANALYSIS. (2009) 246-248 | |
| ISHIKAWA, Nobuhiro, AOYAGI, Takeshi, KIMURA, Takashi, FURUYA, Kazuo, Takahiro Harada, Takashi Inami. IN-SITU OBSERVATION OF THE REACTION BETWEEN IRON AND CARBON IN TEM. JOURNAL OF SURFACE ANALYSIS. (2009) 333-336 | |
| TANUMA, Shigeo. An Improved Backscattering Correction Equation for Wide Analytical Conditions on Quantitative Auger Analysis. JOURNAL OF SURFACE ANALYSIS. (2009) 312-316 | |
| SHINOTSUKA, Hiroshi, YOSHIKAWA, Hideki, TANUMA, Shigeo. Calculation of Depth Distribution Functions for CuO and SiO2. JOURNAL OF SURFACE ANALYSIS. (2009) 317-320 | |
| YOSHIKAWA, Hideki, TANAKA, Hiromi, Masahiro Kimura, OGIWARA, Toshiya, KIMURA, Takashi, FUKUSHIMA, Sei, KUMAGAI, Kazuhiro, TANUMA, Shigeo, Mineharu Suzuki, KOBAYASHI, Keisuke. Evaluation of Depth Distribution Function for AR-XPS using Synchrotron Radiation Hard X-ray. JOURNAL OF SURFACE ANALYSIS. (2009) 254-258 | |
| IWAI, Hideo, John S. Hammond, TANUMA, Shigeo. Recent Status of Thin Film Analyses by XPS. JOURNAL OF SURFACE ANALYSIS. (2009) 264-270 | |
