HOME > 会議録 > 書誌詳細Electron-beam-induced current study of breakdown behavior of high-k gate MOSFETsSEKIGUCHI, Takashi, CHEN, Jun, TAKASE, Masami, FUKATA, Naoki, CHIKYOW, Toyohiro, Motoyuki Sato, Ryu Hasunuma, Kikuo Yamabe, Yasuo Nar. SOLID STATE PHENOMENA 461-466. 2010.https://doi.org/10.4028/www.scientific.net/156-158.461 NIMS著者陳 君深田 直樹知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:41:51 +0900 更新時刻: 2026-09-07 08:04:03 +0900
