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(Invited) Characteristics of GaN/High-k Capacitors Under Positive Bias Stress

ECS Transactions 109-117. 2023.

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Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2023-10-20 03:13:02 +0900 Updated at: 2026-10-08 08:51:21 +0900

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