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Role of the ionicity in defect formation of Hf-based dielectrics

UMEZAWA, Naoto, Kenji Shiraishi, Seiichi Miyazaki, Akira Uedono, Yasushi Akasaka, Seiji Inumiya, Atsushi Oshiyama, Ryu Hasunuma, Kikuo Yamabe, MOMIDA, Hiroyoshi, OHNO, Takahisa, OHMORI, Kenji, CHIKYOW, Toyohiro, Yasuo Nara, Keisaku Yamada.
ECS Transactions 199-211. 2007.

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    Created at: 2017-02-27 01:20:02 +0900Updated at: 2017-03-17 03:19:55 +0900

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