Role of the ionicity in defect formation of Hf-based dielectrics

UMEZAWA, Naoto, Kenji Shiraishi, Seiichi Miyazaki, Akira Uedono, Yasushi Akasaka, Seiji Inumiya, Atsushi Oshiyama, Ryu Hasunuma, Kikuo Yamabe, MOMIDA, Hiroyoshi, OHNO, Takahisa, OHMORI, Kenji, CHIKYOW, Toyohiro, Yasuo Nara, Keisaku Yamada.

作成時刻: 2017-02-27 01:20:02 +0900更新時刻: 2017-03-17 03:19:55 +0900