HOME > 会議録 > 書誌詳細Role of the ionicity in defect formation of Hf-based dielectricsUMEZAWA, Naoto, Kenji Shiraishi, Seiichi Miyazaki, Akira Uedono, Yasushi Akasaka, Seiji Inumiya, Atsushi Oshiyama, Ryu Hasunuma, Kikuo Yamabe, MOMIDA, Hiroyoshi, OHNO, Takahisa, OHMORI, Kenji, CHIKYOW, Toyohiro, Yasuo Nara, Keisaku Yamada. ECS Transactions 199-211. 2007.NIMS著者知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:20:02 +0900更新時刻: 2017-03-17 03:19:55 +0900