HOME > Proceedings > DetailEvaluation of Depth Distribution Function for AR-XPS using Synchrotron Radiation Hard X-ray(放射光硬Ⅹ線を使った角度分解XPSにおける光電子発生深さ分布関数)YOSHIKAWA, Hideki, TANAKA, Hiromi, Masahiro Kimura, OGIWARA, Toshiya, KIMURA, Takashi, FUKUSHIMA, Sei, KUMAGAI, Kazuhiro, TANUMA, Shigeo, Mineharu Suzuki, KOBAYASHI, Keisuke. JOURNAL OF SURFACE ANALYSIS 254-258. 2009.NIMS author(s)YOSHIKAWA, HidekiOGIWARA, ToshiyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:38:53 +0900 Updated at: 2018-05-21 20:31:42 +0900