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ダイヤモンドダイオードの漏れ電流を誘起する欠陥検出
(Detection of defects inducing large leakage current of diamond diodes)
第79回応用物理学会秋季学術講演会. September 18, 2018-September 21, 2018.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2019-05-28 03:00:45 +0900 Updated at: 2019-05-28 03:00:45 +0900