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Electron-beam-induced current characterization of high-k dielectrics
The 5th International Symposium on Advanced Science and Technolo. November 10, 2008-November 14, 2008.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:53:18 +0900 Updated at: 2017-07-10 20:21:22 +0900