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エリプソメトリーによるペロブスカイト薄膜の屈折率評価
(Refractive index of perovskite thin films studied by ellipsometry)
応用物理学会秋季学術講演会. 2016.
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Created at: 2017-02-14 10:59:54 +0900Updated at: 2017-07-10 22:27:00 +0900