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エリプソメトリーによるペロブスカイト薄膜の屈折率評価
(Refractive index of perovskite thin films studied by ellipsometry)
応用物理学会秋季学術講演会. September 13, 2016-September 16, 2016.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:59:54 +0900 Updated at: 2017-07-10 22:27:00 +0900