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AuthorNODA, Takeshi, SHIRAI, Yasuhiro, MIYAZAKI, Hideki, YANAGIDA, Masatoshi, MIYANO, Kenjiro, HAN, Liyuan.
Titleエリプソメトリーによるペロブスカイト薄膜の屈折率評価
(Refractive index of perovskite thin films studied by ellipsometry)
Event name応用物理学会秋季学術講演会
Year of publication2016
LanguageJapanese
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