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ナノ計測技術によるアルミナ系ReRAMデバイス開発
(Development of alumina system ReRAM devices by mesuring technique at the nanometer scale)
第３回AIST-NIMS計測分析シンポジウム. 2011-12-09. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:58:24 +0900 Updated at: 2024-03-05 11:43:45 +0900