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(Study on oxygen and metal migration at Pt or Cu/HfO2 interfaces under bias operation for oxide based ReRAM application)
The Seventh International Nanotechnology Conference on Communic. 2011.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:22:40 +0900Updated at: 2017-07-10 21:04:37 +0900