HOME > 口頭発表 > 書誌詳細Characteristics of GaN/High-k capacitors under positive bias stressNABATAME, Toshihide, SAWADA, Tomomi, IROKAWA, Yoshihiro, KOIDE, Yasuo, TSUKAGOSHI, Kazuhito. 244th ECS Meeting. 2023. 招待講演NIMS著者生田目 俊秀色川 芳宏小出 康夫塚越 一仁Materials Data Repository (MDR)上の本文・データセット作成時刻: 2023-10-19 03:14:41 +0900更新時刻: 2024-01-09 03:09:29 +0900
