HOME > Presentation > DetailCathodoluminescence study of stacking faults and dislocations in bulk GaNイ ウェイ, 陳 君, 伊藤俊, 湯 代明, ジョ ユージン, 大島 祐一, 関口 隆史. 19th International Microscopy Congress. September 09, 2018-September 14, 2018.NIMS author(s)CHEN, JunTANG, DaimingOSHIMA, YuichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-08-30 16:22:43 +0900 Updated at: 2018-08-30 16:22:43 +0900